Atomic force microscopy
Atomic Force Microscope
In plain English
Binnig, Quate and Gerber introduced a microscope that probes surfaces by measuring forces between a sharp tip and a sample.
On the show1
Key findings1
- 01
Binnig, Quate and Gerber introduced a microscope that probes surfaces by measuring forces between a sharp tip and a sample.
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G. Binnig, C. F. Quate, Ch. Gerber